
Ohmega-Ply® is tested to rigorous electrical and environmental standards.
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SPECIFICATIONS AND PROPERTIES
OHMEGA-PLY® RESISTOR-CONDUCTOR MATERIAL
| SHEET RESISTIVITIES |
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Standard |
10, 25, 50, 100, 250 ohms per square
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TYPICAL PROPERTIES (EPOXY-GLASS DIELECTRIC)
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ETCHED RESISTOR VARIATION (0.5" x 0.5"
RESISTOR SIZE)
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10 ohms per square
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Plus or minus 3%
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25, 50, 100 ohms per square
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Plus or minus 5%
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| 250 ohms per square |
Plus or minus 10% |
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RESISTANCE CHANGE AFTER 240 HOURS EXPOSURE TO 95% HUMIDITY AT 40 ºC |
2% maximum |
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CURRENT NOISE (PER MIL-STD-202, METHOD 308)
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Less than -15 db
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MAXIMUM TEMPERATURE COEFFICIENT OF
RESISTANCE (-65 ºC TO 125 ºC)
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| 10 ohms per square |
-20 ppm per degree C |
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25 ohms per square
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-50 ppm per degree C
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50 ohms per square
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-80 ppm per degree C
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100 ohms per square
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+100 ppm per degree C
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250 ohms per square
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+100 ppm per degree C
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RESISTANCE CHANGE AFTER 1000 HOURS 70 ºC
AMBIENT TEMPERATURE
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| 10 ohms per square |
0.4% max (10 Watts/square load) |
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25 ohms per square
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0.5% max (5 Watts/square load)
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50 ohms per square
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1.0% max (2.5 Watts/square load)
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100 ohms per square
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1.0% max (2.5 Watts/square load) |
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250 ohms per square
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1.0% max (2.5 Watts/square load) |
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TCR TRACKING
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25 ohms per square
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Plus or minus 7 ppm per degree C max; Less than 2 ppm per degree
C average
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100 ohms per square
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Plus or minus 15 ppm per degree C max; Less than 8 ppm per degree
C average
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RECOMMENDED POWER DISSIPATION
The figure shows the recommended power dissipation of
small resistor area (less than 1100 mil2) at 25 °C ambient
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FOR RESISTOR AREA LARGER THAN 1100
MIL2, THE RECOMMENDED POWER DISSIPATION AT 25°C AMBIENT IS AS FOLLOWS:
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| 10 ohms per square |
0.190+ MilliWatts/mil2 |
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25 ohms per square
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0.150+Milliwatts/mil2 |
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50 ohms per square
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0.138+Milliwatts/mil2 |
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100 ohms per square
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0.100+Milliwatts/mil2 |
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250 ohms per square
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0.090+Milliwatts/mil2 |
Maximum power dissipation depends on the ambient temperature, resistor element size and laminate/circuit board thermal properties. Dissipation improves with the use of natural heatsinks such as ground and power planes. Typical power dissipation for most Ohmega-Ply resistor designs operating at an ambient of less than 70 °C is approximately 1/10 to 1/8 Watt.
Note: Because of continuing product improvement, the above specifications and properties are subject to change. The information and data contained herein are based on tests to date, but no warranty thereof is given.
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VII) RELIABILITY TEST DATA AND SPECIFICATIONS
- Ohmega-Ply® has been used in numerous applications for over 25 years; exhibiting excellent performance and dependability. Due to its absolute long-term reliability under a variety of severe environmental conditions, Ohmega-Ply® is used in numerous critical products (space-base, aerospace, avionics, etc.) where the utmost in reliability is required.
- The estimated failure rate for Ohmega-Ply® resistors is less than 0.001 resistor elements per 1 million operating hours (this is based on test results where over 1 trillion component hour have been accumulated without a field failure. Field failure is defined as resistor failure that is caused by the resistive material itself, and not other sources of printed circuit board failure (opens, shorts, defective base material, excessive power surges, improper operating conditions, etc.).
- Ohmega-Ply® Specifications and Properties
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OHMEGA-PLY® RCM PROPERTIES AND SPECIFICATIONS
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Remark & Condition
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Sheet Resistivities (ohm/square)
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10 |
25
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50
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100
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250
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Material Tolerance
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+/-3 |
+/-5
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+/-5
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+/-5
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+/-10
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Load Life Cycling Test
( R%) |
<0.4
(after 1000 hrs) |
<5
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<5
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<5
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0.5
(after 1000 hrs)
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MIL-STD-202-108I
Ambient Temp: 70C
On Cycle: 1.5 hrs
Off Cycle: 1.5 hrs
Length of Test:
10000 hrs
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Current Noise Index in dB
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<-16 |
<-15
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<-15
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<-15
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<-15
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MIL-STD-202-308
Voltage Applied
10 ohm/sq.: 53.2V
25 ohm/sq.: 5.6V
100 ohm/sq.: 7.9V
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Short Time Overload
( R%)
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0 |
0
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0
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0
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0
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MIL-R-10509 Method 4.6.6
Power: 2.5 X Rated
Time: 5 Sec
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Resistance Temperature Characteristic
(RTC) PPM/ºC
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13 |
50
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60
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100
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100
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MIL-STD-202-304
Hot Cycle: 25º , 50º, 75º & 125ºC
Cold Cycle: 25º, 0º, -25º & -55ºC
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Humidity Test
( R%)
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0.3 |
0.5
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0.75
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1.0
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2.0
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MIL-STD-202-103A
Temp: 40șC
Relative Humidity: 95 %
Time: 240 hrs
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Thermal Shock
( R%)
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0.1 |
-0.5
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1.0
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1.0
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1.0
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MIL-STD-202-107B
No. of Cycles: 25
Hot Cycle Temp: 125ºC
Cold Cycle Temp: -65ºC
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Hot Oil
( R%)
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-- |
0.1
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0.25
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0.5
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0.75
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IPC-TM-650 METHOD 2.4.6
Temp: 260ºC
Immersion: 20ºC
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Solder Float
( R%)
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0.2 |
0.5
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0.75
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1.0
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0.5
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MIL-STD-202-210D
Temp: 260ºC
Immersion: 20 Seconds |
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Resistance To Solvent
( R%)
Tolerance 1-1-1:
Trichloroethan:
Acetone:
Freon:
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N/A |
0.2
0.0
0.2
0.0
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N/A
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N/A
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N/A |
MIL-STD-202-215A
Immersion: 15 Min
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Capacitance(pF)
(at 5 Hz)
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~0 |
~1
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~1
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~1
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~1
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Inductance(nH)
(at 5 Hz)
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<~0.6 |
<~0.6
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<~0.6
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<~0.6
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<~0.6
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- In addition to in-house reliability testing at Ohmega Technologies, Inc., there have been numerous tests performed on Ohmega-Ply® by OEM customers and prospective customers. A few of them are:
Cray Research1
In a study of the stability of buried Ohmega-Ply® resistors used for ECL termination, Cray concluded that the Ohmega-Ply® resistors “would operate well beyond all normal voltages and temperatures, and there have been no reports of a resistor failure due to resistive material.” Cray Research also found that incorporating the Ohmega-Ply resistors into the internal plane of a multilayer board substantially improved the signal quality for high-speed devices. Cray Research has used Ohmega-Ply® in millions of multilayer circuit boards since 1982 with absolute field reliability of the resistive elements.
Alcatel Bell2
Researchers at Alcatel Bell tested Ohmega-Ply resistors for broadband (45 MHz-5GHz) telecom applications to characterize its impedance response and to compare the reliability of Ohmega-Ply to 0805 discrete thick film chip resistors, rated power 125 mW. A summary of their results is as follows. |
| Type of Test |
Measured max./min. R (Alcatel Tested) |
Ohmega Specifications |
Thick film chip R (0805) |
Humidity Test
Temp: 40ºC
Relative Humidity: 93% |
After 21 days:
0.22% for 25 Ohm/sq.
0.07% for 100 Ohm/sq.
0.10% for 250 Ohm/sq.
After 56 days:
0.74% for 25 Ohm/sq.
0.14% for 100 Ohm/sq.
0.22% for 250 Ohm/sq.
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After 10 days:
0.5% for 25 Ohm/sq.
1.0% for 100 Ohm/sq.
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After 56 days:
< ± 1.50% |
Thermal Cycling
Hot Cycle Temp: 125ºC
Cold Cycle: -25 ºC |
After 100 Cycles
-0.03% for 25 Ohm/sq.
0.03% for 100 Ohm/sq.
-0.08 for 250 Ohm/sq. |
After 25 Cycles
-0.5% for 25 Ohm/sq.
1% for 100 Ohm/sq. |
<± 0.25%
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Aging Without Load
Temp: 125ºC |
After 100 Hours
0.10% for 25 Ohm/sq
0.08% for 100 Ohm/sq
-0.13% for 250 Ohm/sq |
Not specified |
Not specified |
Solder Heat/Float
Temp: 260ºC
Immersion: 20ºC |
-0.02% for 25 Ohm/sq
0.01% for 100 Ohm/sq
-0.01% for 250 Ohm/sq |
0.5% for 25 Ohm/sq
1% for 100 Ohm/sq |
<± 0.25% |
| Sheet Resistivity Ohm/sq. |
Lmin (nH) |
Lmax (nH) |
Cmin (pF) |
Cmax (pF) |
|
25
100
250
Short
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0.599
0.622
0.571
0.6
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0.657
0.682
0.653
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0.935
1.053
1.117
1
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1.139
1.154
1.202
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| Minimum and maximum parasitic effects extracted from measured characteristic
of integrated resistor
IBM3
IBM built and tested a numbers of evaluation boards that incorporated Ohmega-Ply® into number of internal layers of a multiplayer design. This effort was to see what effect, if any, there was on the assembly (and rework) process due to the embedded resistors. In addition, standard environmental stress tests were performed (including thermal cycling, thermal shock, vibration testing and torque testing). The findings of their published report showed “no significant resistance change on the resistors from the assembly process and stress test”.
Unisys4
In evaluating the long term drift characteristics of Ohmega-Ply® on high Tg, low DC substrate, Unisys concluded that powered (22 mA), Ni-P buried resistors, fabricated using ammoniacal etch process and fully aqueous resist, when placed in a 55 °C cabinet environment, will drift < 2 % in 100,000 hours (11.4 years).
Dassault5
Dassault Electronique did a 2 year study of Ohmega-Ply® for an active phased array antenna (X-band). The resistors were used in a stripline configuration a PTFE substrate (Rogers RT Duroid® 60002 and fusion bonded inside a multilayer package). The Ohmega-Ply® was compared to chip resistors and screen printed polymer inks. Ohmega-Ply® was selected for use due to superior tolerance and stability (compared to printed polymer inks) and space saving, parasitic reduction, and solder joint removal (compared to chip resistors). The results of testing are as follows:
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| Etching Tolerance |
Minimum Resistor Width |
Tolerance After Fusion Bonding |
Influence of Ohmega-Ply Foil Layer on Microwave Properties |
Shift of Resistor Values After 500 Thermal Cycles (-55ºC, +125ºC) |
Thermal Coefficient of Resistance Within the Range (-55ºC, +125ºC) |
Power Handling |
No shift in microwave performance of two ports power divider, when
Ohmega Foil Technology is tested under the following conditions: |
| 5% |
200 µ m |
7% |
NO |
Microstrip: +2%
Stripline: +3% |
Microstrip: ±6%
Stripline: ±7% |
300 mW |
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Rogers Corporation6
In an internal study, Rogers evaluated Ohmega-Ply® resistors on Kapton® /Pyralux®. They found the following change in a resistor that was 0.25” x 4.0” in size with a flex radius of 0.25” (the flex rate was 10 cycles/minute): |
| Number of Flex Cycles |
% Change in Resistance |
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150
1,500
10,000
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0.5
6.1
25.5
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| When a cover film or conformal coating was placed over the resistors (or, the resistors were multilayered on an internal plane of circuitry), and flexed up to 250,000 cycles, there was no significant change in resistance.
References
- Mahler, Bruce and Schroeder, Paul, “Planar Resistors in PCB Design”, Electronic Manufacturing, January 1989.
- Peeters, Joris et all., “Characterization of Integrated Resistors for Broadband Telecom Printed Circuit Boards”, IPC World Expo, June 1996.
- Martin, Cynthia, “Passive Devices Buried Resistors”, report from IBM, Austin, TX, 1998.
- Murphy, Tim, “Long Term Drift of Ni-P Buried Resistors on Cyanate Ester laminate”, IPC Printed Circuit Expo, 1994.
- Ledain, Bernard and Herblot, Jean, “Innovative Multilayer Technologies for Active Phased Array Antennas”, report from Dassault Electronique Saint-Cloud, France.
- Nguyen, Phong, “Shelf-Life and Flex-Life of Ohmega-Ply Materials”, Roger Microwave Conference, June 1989.
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